Differences between SEM, TEM, and AFM.
The Scanning Electron Microscope is a type of electron microscope. It produces the images by scanning with a beam of electrons. In this way, the electrons interact with atoms in the sample, originates signals. These signals contain information about the sample’s composition and topography. In this method, the beam’s position gets combined with the received signals to produce an image. Resolution achieved is better than 1 nanometer; the specimen can be studied in high or low vacuum, or in wet conditions and in cryogenic or elevated temperatures. Because of SEM micrographs which provide three dimensional appearances, understanding the surface structure of a sample becomes easier.
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